Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/15732
Title: Electroplating-induced degradation in ZnO ceramic varistors
Authors: Chen, WP
Chan, HLW 
Issue Date: 2005
Publisher: Springer
Source: Journal of materials science, 2005, v. 40, no. 24, p. 6593-6596 How to cite?
Journal: Journal of materials science 
Abstract: The phenomenon of degradation induced by electroplating in ZnO ceramic varistors was investigated. It was found that for ZnO ceramic varistors with dense microstructure, electroplating exerts a twofold influence on the varistors. Atomic hydrogen generated in electroplating reduced ZnO to Zn in the surface of the varistors and nickel was deposited on Zn subsequently. It was shown that hydrogen weakens the potential barrier at the grain boundaries of the varistors causing great increases in the leakage current and the dielectric loss of the varistors.
URI: http://hdl.handle.net/10397/15732
ISSN: 0022-2461
EISSN: 1573-4803
DOI: 10.1007/s10853-005-2149-7
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