Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/15537
Title: Self-testable full range window comparator
Authors: Zhang, YB
Wong, MWT
Keywords: Built-in self test
Comparators (circuits)
System-on-chip
Issue Date: 2004
Publisher: IEEE
Source: TENCON 2004 : 2004 IEEE Region 10 Conference : proceedings : analog and digital techniques in electrical engineering : 21-24 November, 2004, Chiang Mai, Thailand, v. 4, p. 262-265 How to cite?
Abstract: In this paper, a novel full range window comparator with self-testability feature is presented. The use of a mixed-signal full range window comparator for built-in-self-test (BIST) of analogue cores in system-on-chip (SOC) was described in. Therefore we leverage on the design effort already spent in providing an effective means of testing SOCs, by making the comparator self-testable hence the potential problem of a faulty comparator circuit during test mode operation is greatly reduced.
URI: http://hdl.handle.net/10397/15537
ISBN: 0-7803-8560-8
DOI: 10.1109/TENCON.2004.1414919
Appears in Collections:Conference Paper

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