Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/14601
Title: Structural and ferroelectric properties of europium doped lead zirconate titanate thin films by a sol-gel method
Authors: Yu, YJ
Chan, HLW 
Wang, FP
Li, K
Choy, CL 
Zhao, LC
Keywords: Dielectrics
Ferroelectric properties
PZT thin films
Rare earth dopant
Sol-gel process
Issue Date: 2003
Publisher: Elsevier
Source: Thin solid films, 2003, v. 424, no. 2, p. 161-164 How to cite?
Journal: Thin solid films 
Abstract: Using a sol-gel method, rare earth element europium doped lead zirconate titanate thin films with a pure perovskite structure were obtained. The effects of excess lead and pyrolyzing temperature on the crystalline structure of the thin films were investigated using X-ray diffraction. Their ferroelectric and dielectric properties were determined by P-E loop and impedance measurements. The remnant polarization is 23.5 μC/cm2 and the coercive electric field strength is 5.5 kV/mm. The dielectric constant and the dissipation factor is approximately 950 and 0.07, respectively.
URI: http://hdl.handle.net/10397/14601
ISSN: 0040-6090
EISSN: 1879-2731
DOI: 10.1016/S0040-6090(02)01052-0
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