Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/14332
Title: Hydrogen-induced degradation in NiCuZn ferrite-based multilayer chip inductors
Authors: Chen, WP
Qi, JQ
Wang, Y 
Wang, XH
Ma, ZW
Li, LT
Chan, HLW 
Keywords: Degradation
Ferrite
Hydrogen
Inductor
Issue Date: 2005
Publisher: North-Holland
Source: Materials letters, 2005, v. 59, no. 13, p. 1636-1639 How to cite?
Journal: Materials letters 
Abstract: Hydrogen-induced degradation in Ni0.38Cu0.12Zn 0.50Fe2O4-based multilayer ceramic chip inductors was studied through an electrochemical hydrogen charging method, in which the silver electrodes of the inductors were made a cathode in 0.01 M NaOH solution to evolve hydrogen by the electrolysis of water. After the treatment, the inductance and the quality factor of the inductors at high frequencies were dramatically decreased. The degradation showed a little spontaneous recovery at room temperature and could be mostly recovered through a heat-treatment of 4 h at 250°C in N2. It is proposed that hydrogen generated by the electrolysis of water is incorporated into the ferrite lattice and exists as an interstitial proton after reducing Fe3+ to Fe2+. The stability of hydrogen in ferrites decreased with increasing temperature and its outdiffusion resulted in the recovery. Hydrogen-induced degradation is important to ferrite-based chip inductors in fabrication and in operation.
URI: http://hdl.handle.net/10397/14332
ISSN: 0167-577X
EISSN: 1873-4979
DOI: 10.1016/j.matlet.2005.01.031
Appears in Collections:Journal/Magazine Article

Access
View full-text via PolyU eLinks SFX Query
Show full item record

SCOPUSTM   
Citations

5
Last Week
0
Last month
0
Citations as of Apr 9, 2018

WEB OF SCIENCETM
Citations

4
Last Week
0
Last month
0
Citations as of Apr 17, 2018

Page view(s)

53
Last Week
0
Last month
Citations as of Apr 15, 2018

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.