Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/14161
Title: Effects of substrate temperature and film thickness on the structural behavior of pulsed laser deposited Pb(Mg1/3 Nb2/3)O 3-PbTiO3(65/35) epitaxial thin films
Authors: Cheng, KC
Chan, HLW 
Wong, KH
Keywords: Film thickness
Laser ablation
PMN-PT
Substrate temperature
X-ray diffraction
Issue Date: 2005
Publisher: Taylor & Francis Inc.
Source: Ferroelectrics, 2005, v. 328, p. 79-84 How to cite?
Journal: Ferroelectrics 
Abstract: Pure perovskite phase 0.65 mol% lead magnesium niobate-0.35 mol% lead titanate (abbreviated as PMN-PT) thin films were grown on a MgO substrate by pulsed laser deposition. The crystal structure and epitaxial orientation of the films were analyzed by means of X-ray diffraction. A θ-2θ scan and off-axis Φ scan showed that the PMN-PT films were epitaxially grown with c-axis orientated normal to the surface of the MgO substrate. With increase in substrate temperature, the crystallinity of the film was enhanced for temperature below 660°C. Lattice structure of the film showed a strong dependence on the increase in film thickness. The crystallinity of the film was also enhanced with increasing in the film thickness.
URI: http://hdl.handle.net/10397/14161
ISSN: 0015-0193
EISSN: 1563-5112
DOI: 10.1080/00150190500311243
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