Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/14067
Title: Measurement and characterization of ultra-precision freeform surfaces using an intrinsic surface feature-based method
Authors: Cheung, CF 
Kong, LB
Ren, MJ
Keywords: Freeform surface
Gaussian curvature
Intrinsic surface features
Precision surface measurement
Surface characterization
Surface reconstruction
Surface registration
Ultra-precision
Issue Date: 2010
Publisher: IOP Publishing Ltd
Source: Measurement science and technology, 2010, v. 21, no. 11, 115109 How to cite?
Journal: Measurement Science and Technology 
Abstract: Ultra-precision freeform surfaces are complex surfaces that possess non-rotational symmetry and are widely used in advanced optics applications. Due to the geometrical complexity of optical freeform surfaces, there is, as yet, a lack of generalized surface characterization methods which measure various types of ultra-precision freeform surfaces with sub-micrometer form accuracy and surface finish in the nanometer range. To make good this deficiency, a generalized approach for the measurement and characterization of ultra-precision freeform surfaces, named the intrinsic surface feature-based method (ISFM), is presented in this paper. The ISFM makes use of intrinsic surface properties (e.g. curvatures, normal vectors, torsion and intrinsic frames) to conduct data matching or uses some algorithms to search for correspondences such as correlation functions. The method is experimentally verified through a series of measurement experiments. The results show that the proposed ISFM is capable of addressing the deficiencies and limitations of traditional freeform surface characterization methods which are susceptible to outliers and to uncertainty due to the geometry of the freeform surfaces. ISFM is a generalized methodology which is not dependent on the type of freeform surface being characterized.
URI: http://hdl.handle.net/10397/14067
DOI: 10.1088/0957-0233/21/11/115109
Appears in Collections:Journal/Magazine Article

Access
View full-text via PolyU eLinks SFX Query
Show full item record

SCOPUSTM   
Citations

14
Last Week
0
Last month
0
Citations as of Jan 17, 2017

WEB OF SCIENCETM
Citations

13
Last Week
1
Last month
2
Citations as of Jan 17, 2017

Page view(s)

19
Last Week
0
Last month
Checked on Jan 22, 2017

Google ScholarTM

Check

Altmetric



Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.