Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/14030
Title: Effects of texture on the dielectric properties of Ba(Zr 0.2Ti0.8)O3 thin films prepared by pulsed laser deposition
Authors: Tang, XG
Wang, XX
Wong, KH
Chan, HLW 
Issue Date: 2005
Publisher: Springer
Source: Applied physics. A, Materials science & processing, 2005, v. 81, no. 6, p. 1253-1256 How to cite?
Journal: Applied physics. A, Materials science & processing 
Abstract: Ba(Zr0.2Ti0.8)O3 (BZT) thin films were deposited on Pt(111)/Ti/SiO2/Si(100) substrates by a pulsed laser deposition process. The BZT thin films directly grown on annealed and un-annealed Pt/Ti/SiO2/Si substrates exhibited random and high (100) orientations, respectively. The dielectric constant of a 400-nm-thick BZT film with (100) orientation was 331, which was higher than that of a BZT film with random orientation (∼236). This result is attributed to the fact that the polar axis of the (100)-oriented films was more tilted away from the normal to the film surface than that of the randomly oriented films. Also, the tunabilities of BZT thin films with random and (100) orientations were ∼50% and ∼59% at an applied field of 400 kV/cm, respectively. Improved tunability has been attributed to the (100) texture of the film leading to an enhancement of the in-plane-oriented polar axis.
URI: http://hdl.handle.net/10397/14030
ISSN: 0947-8396
EISSN: 1432-0630
DOI: 10.1007/s00339-004-2980-8
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