Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/13547
Title: Envelope probability and EFAST-based sensitivity analysis method for electronic prognostic uncertainty quantification
Authors: Sun, B
Pan, W
Wang, Z
Yung, KC 
Keywords: EFAST
Electronic
Envelope-probability
Prognostic
Sensitivity analysis
Uncertainty
Issue Date: 2015
Publisher: Pergamon Press
Source: Microelectronics reliability, 2015 How to cite?
Journal: Microelectronics reliability 
Abstract: The primary phase of electronic prognostic uncertainty quantification included the identification and quantification of uncertainty sources through utilizing sensitivity analysis method. An improved EFAST-based sensitivity analysis method that considered the possibility of parameter fluctuation was used to identify the key factors (KFS) of uncertainty sources. Also, an envelope probability method was adopted to further quantify the key factors of parameter distribution. Finally, a board-level electronic product was chosen as the study case of this paper. Comparing the result of uncertainty quantification, sensitivity analysis was used to drive the result of the single-dimensional method. It was obvious that the sensitivity analysis method used in this paper has optimized the input parameters of the model and improved the accuracy of electronic prognostic uncertainty quantification.
URI: http://hdl.handle.net/10397/13547
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2015.06.115
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