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Title: Non-contact measurement of material property
Authors: Zheng, YP 
Lu, MH
Keywords: Non-contact measurement
Material property
Issue Date: 24-Oct-2006
Source: US Patent 7,124,636 B2. Washington, DC: US Patent and Trademark Office, 2006. How to cite?
Abstract: A process for measuring a property of a sample is provided. The sample has an external surface enclosing an inner portion, and firstly, the sample is deformed by applying a predetermined non-contact pressure to deform a portion of the sample. Then a signal, which is at least suitable for transmission over the air, is directed towards the deformed portion of the sample, and further propagates through the external surface and the inner portion of the sample. Then an echoed signal generated by the inner portion of the sample in response to the propagation of the signal is detected; wherein the echoed signal incorporates information relating to a deformation of the inner portion of the sample. The property of the sample is determined from the deformation of the inner portion of the sample.
Rights: Assignee: The Hong Kong Polytechnic University.
Appears in Collections:Patent

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