Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/12269
Title: Dislocation density in SrTiO3 film grown on DyScO3 by pulse laser ablation
Authors: Zhai, ZY
Li, XZ
Zhi, SS
Wu, XS
Hao, JH 
Gao, J
Issue Date: 2007
Publisher: World Scientific Publ Co Pte Ltd
Source: Surface review and letters, 2007, v. 14, no. 4, p. 779-782 How to cite?
Journal: Surface Review and Letters 
Abstract: SrTiO3 films are fabricated on DyScO3 substrates by pulse laser deposition. In situ X-ray diffraction (XRD) is used to characterize the thermal expansion coefficient at low temperature. The abnormal behavior in lattice parameter at 80K may be the hint of a phase transition. High resolution XRD is performed to detect the two kinds of dislocations, i.e. screw and edge. Results show that the density of edge dislocation is a little larger than that of the screw one. The total dislocation density has the order of about 10 cm . Edge dislocation density decreases with the increase of the film thickness. We argue that the ratio between these two dislocation densities results in the growth mode of the film.
URI: http://hdl.handle.net/10397/12269
DOI: 10.1142/S0218625X07010251
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