Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/12162
Title: Image enhancement for fringe projection profilometry
Authors: Ng, WL
Lun, DPK 
Keywords: Cameras
Computerised instrumentation
Deformation
Image enhancement
Image reconstruction
Optical projectors
Surface topography measurement
Wavelet transforms
Issue Date: 2013
Publisher: IEEE
Source: 2013 IEEE International Symposium on Circuits and Systems (ISCAS), 19-23 May 2013, Beijing, p. 729-732 How to cite?
Abstract: The fringe projection profilometry (FPP) is a popular approach for acquiring high-fidelity 3D model of objects. In the FPP, parallel fringe patterns are projected onto an object, and the deformed fringe as shown on the object surface is captured by a camera for 3D reconstruction. Due to the imperfection of imaging devices and operating environment, the captured fringe images however are inevitably to have many artifacts. They severely affect the robustness of the FPP and the quality of the reconstructed 3D model. In this paper, a new approach is proposed that successfully characterizes some common artifacts of fringe images, such as bias and noise, using the dual-tree complex wavelet transform. Effective methods are then devised to remove them from the fringe images. Experimental results show that the proposed algorithm is superior to the traditional methods and facilitates accurate reconstruction of objects' 3D model even with low quality fringe images.
URI: http://hdl.handle.net/10397/12162
ISBN: 978-1-4673-5760-9
ISSN: 0271-4302
DOI: 10.1109/ISCAS.2013.6571950
Appears in Collections:Conference Paper

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