Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/11722
DC FieldValueLanguage
dc.contributorDepartment of Applied Physics-
dc.creatorZhou, QF-
dc.creatorChan, HLW-
dc.creatorChoy, CL-
dc.date.accessioned2014-12-19T07:02:18Z-
dc.date.available2014-12-19T07:02:18Z-
dc.identifier.issn0947-8396-
dc.identifier.urihttp://hdl.handle.net/10397/11722-
dc.language.isoenen_US
dc.publisherSpringeren_US
dc.titleStructural and optical characterization of PLT thin films prepared by a sol-gel processen_US
dc.typeJournal/Magazine Articleen_US
dc.identifier.spage293-
dc.identifier.epage296-
dc.identifier.volume70-
dc.identifier.issue3-
dc.identifier.doi10.1007/s003390050049-
dcterms.abstractLanthanum-modified lead titanate (PLT) thin films were deposited on fused-quartz substrates using a sol-gel process. The crystallization behaviour and structural changes were studied as a function of the annealing temperature by differential thermal analysis, thermogravimetry, infrared spectroscopy, and X-ray diffraction. The surface morphology of the films was characterized in a scanning electron microscope. The absorption edge was found to shift to longer wavelength with increasing crystallite size.-
dcterms.bibliographicCitationApplied physics. A, Materials science & processing, 2000, v. 70, no. 3, p. 293-296-
dcterms.isPartOfApplied physics. A, Materials science & processing-
dcterms.issued2000-
dc.identifier.isiWOS:000086255400008-
dc.identifier.scopus2-s2.0-0034156318-
dc.identifier.eissn1432-0630-
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