Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/11722
Title: Structural and optical characterization of PLT thin films prepared by a sol-gel process
Authors: Zhou, QF
Chan, HLW 
Choy, CL 
Issue Date: 2000
Publisher: Springer-Verlag GmbH & Company KG
Source: Applied physics A : materials science and processing, 2000, v. 70, no. 3, p. 293-296 How to cite?
Journal: Applied Physics A: Materials Science and Processing 
Abstract: Lanthanum-modified lead titanate (PLT) thin films were deposited on fused-quartz substrates using a sol-gel process. The crystallization behaviour and structural changes were studied as a function of the annealing temperature by differential thermal analysis, thermogravimetry, infrared spectroscopy, and X-ray diffraction. The surface morphology of the films was characterized in a scanning electron microscope. The absorption edge was found to shift to longer wavelength with increasing crystallite size.
URI: http://hdl.handle.net/10397/11722
ISSN: 0947-8396
DOI: 10.1007/s003390050049
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