Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/11561
Title: RFID-based colored Petri net applied for quality monitoring in manufacturing system
Authors: Lv, Y
Lee, CKM
Chan, HK
Ip, WH 
Keywords: Colored Petri net modeling
Manufacturing process
Process quality control
Product quality monitoring
Real-time analysis
RFID
Issue Date: 2012
Publisher: Springer
Source: International journal of advanced manufacturing technology, 2012, v. 60, no. 1-4, p. 225-236 How to cite?
Journal: International journal of advanced manufacturing technology 
Abstract: Product quality is difficult to be traced and monitored in the distributed manufacturing network. This paper proposes and develops a new RFID-based CPN modeling method where the colored tokens are evolved to color-tagged tokens carrying the product information of real-time status. With this new real-time modeling method, the performance of manufacturing systems such as yield rate and throughput can be realized. In this paper, a case study has been conducted to examine the feasibility and effectiveness of the proposed method. The simulation results show that the new modeling method is able to complete the preliminary real-time quality status analysis of a manufacturing system so as to handle dynamic and stochastic manufacturing network effectively and enable decision making for process improvement.
URI: http://hdl.handle.net/10397/11561
ISSN: 0268-3768
EISSN: 1433-3015
DOI: 10.1007/s00170-011-3568-z
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