Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/11123
Title: Misorientation texture of post-recrystallized α-brass
Authors: Lee, WB 
Furley, J
Ralph, B
Issue Date: 1992
Publisher: Springer
Source: Journal of materials science, 1992, v. 27, no. 12, p. 3395-3399 How to cite?
Journal: Journal of materials science 
Abstract: Studies of annealing textures in the past were mainly based on X-ray diffraction for macrotexture and electron diffraction for microtexture. However, the application of the electron back-scattering (EBS) technique now provides a powerful tool to obtain grain-boundary misorientation data (the grain misorientation texture or GMT) and study the change in grainboundary structure during annealing. The change in the GMT of cold-rolled brass annealed at two different temperatures is reported. The proportion of CSL boundaries was found to increase with annealing temperature. The significance of this finding with regards to an understanding of the texture transition and the grain-growth phenomenon is discussed.
URI: http://hdl.handle.net/10397/11123
ISSN: 0022-2461
EISSN: 1573-4803
DOI: 10.1007/BF01116042
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