Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/10627
Title: Analog circuit equivalent faults in the D.C. domain
Authors: Worsman, M
Wong, MWT
Lee, YS
Keywords: Analogue circuits
Built-in self test
Design for testability
Fault location
Fault simulation
Issue Date: 2000
Publisher: IEEE
Source: Proceedings of the Ninth Asian Test Symposium, 2000 : ATS 2000, December 2000, Taipei, p. 84-89 How to cite?
Abstract: Analog circuit faults that produce indistinguishable test measurements are equivalent. Such faults cannot be diagnosed, since they defy fault location and/or value determination. In current simulation-before-test methods equivalent faults are found by inspecting fault simulation data. This approach is unsatisfactory for usually it imparts little information on which aspects of a circuit's design lead to equivalent faults or how diagnosis is to be improved. Presented is an examination of a subset of d.c. domain equivalent faults in steady-state linear analog circuits. The proposed methods for equivalent fault identification are aimed at increasing a test engineer's understanding of the faulty circuit's behaviour beyond that given by data analysis. Ways in which test design benefits from equivalent fault information are also discussed
URI: http://hdl.handle.net/10397/10627
ISBN: 0-7695-0887-1
ISSN: 1081-7735
DOI: 10.1109/ATS.2000.893607
Appears in Collections:Conference Paper

Access
View full-text via PolyU eLinks SFX Query
Show full item record

WEB OF SCIENCETM
Citations

8
Last Week
0
Last month
0
Citations as of Aug 15, 2017

Page view(s)

26
Last Week
1
Last month
Checked on Aug 13, 2017

Google ScholarTM

Check

Altmetric



Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.