Please use this identifier to cite or link to this item:
http://hdl.handle.net/10397/105655
| Title: | Adaptive deep metric learning for identity-aware facial expression recognition | Authors: | Liu, X Kumar, BVKV You, J Jia, P |
Issue Date: | 2017 | Source: | 2017 IEEE Conference on Computer Vision and Pattern Recognition Workshops (CVPRW), 21-26 July 2017, Honolulu, Hawaii, p. 522-531 | Abstract: | A key challenge of facial expression recognition (FER) is to develop effective representations to balance the complex distribution of intra- and inter- class variations. The latest deep convolutional networks proposed for FER are trained by penalizing the misclassification of images via the softmax loss. In this paper, we show that better FER performance can be achieved by combining the deep metric loss and softmax loss in a unified two fully connected layer branches framework via joint optimization. A generalized adaptive (N+M)-tuplet clusters loss function together with the identity-aware hard-negative mining and online positive mining scheme are proposed for identity-invariant FER. It reduces the computational burden of deep metric learning, and alleviates the difficulty of threshold validation and anchor selection. Extensive evaluations demonstrate that our method outperforms many state-of-art approaches on the posed as well as spontaneous facial expression databases. | Publisher: | Institute of Electrical and Electronics Engineers | ISBN: | 978-1-5386-0733-6 (Electronic) 978-1-5386-0734-3 (Print on Demand(PoD)) |
DOI: | 10.1109/CVPRW.2017.79 | Rights: | © 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The following publication X. Liu, B. V. K. V. Kumar, J. You and P. Jia, "Adaptive Deep Metric Learning for Identity-Aware Facial Expression Recognition," 2017 IEEE Conference on Computer Vision and Pattern Recognition Workshops (CVPRW), Honolulu, HI, USA, 2017, pp. 522-531 is available at https://doi.org/10.1109/CVPRW.2017.79. |
| Appears in Collections: | Conference Paper |
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| File | Description | Size | Format | |
|---|---|---|---|---|
| You_Adaptive_Deep_Metric.pdf | Pre-Published version | 3.54 MB | Adobe PDF | View/Open |
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