Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/10275
Title: Fatigue problems in ferroelectric thin films
Authors: Wang, Y
Wong, KH
Choy, CL
Issue Date: 2002
Publisher: Wiley-Blackwell
Source: Physica status solidi a - applications and materials science, 2002, v. 191, no. 2, p. 482-488 How to cite?
Journal: Physica Status Solidi A-Applications and Materials Science 
Abstract: The fatigue problem in ferroelectric thin films is investigated based on the switched charge per unit area versus switching cycles. The temperature, dielectric permittivity, voltage bias, defect valence and frequency dependent switching polarization properties are calculated quantitatively with an extended Dawber-Scott model. The results are compared with recent experiments. Some features of polarization fatigue and in correlation with parameters of ferroelectric thin films are reported.
URI: http://hdl.handle.net/10397/10275
ISSN: 1862-6300
DOI: 10.1002/1521-396X(200206)191:2<482
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