Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/10098
Title: Enhanced dielectric properties of nanocrystalline (Ba 0.65Sr 0.35)TiO 3 thin films grown on CaRuO 3 buffer layers
Authors: Xiong, HF
Tang, XG
Jiang, LL
Chan, HLW 
Keywords: Dielectric properties
Electric field
Orientation
Pulsed laser deposition
Tunability
Issue Date: 2009
Publisher: American Scientific Publishers
Source: Journal of nanoscience and nanotechnology, 2009, v. 9, no. 10, p. 5834-5838 How to cite?
Journal: Journal of nanoscience and nanotechnology 
Abstract: Highly (100)-oriented and (110)-oriented (Ba 0. 65Sr 0. 35)TiO 3 (BSTO) and (Ba 0.65Sr 0.35)TiO 3/CaRuO 3 (BSTO/CRO) heterostructure thin films, have been grown on Pt/Ti/SiO 2/Si substrates prepared by pulsed laser deposition (PLD). The structure and surface morphology of the films have been characterized by X-ray diffraction (XRD) and scanning electron microscope (SEM). The dielectric constants of the films changes significantly with applied dc bias field and have high tunability of 76.3% and 78.1% at an applied field of 256.3 kV/cm, respectively for BSTO and BSTO/CRO thin films on Pt/Ti/SiO 2/Si substrates. The tunability of the BSTO/CRO heterostructure thin films on Pt/Ti/SiO 2/Si substrate was higher than that of the BSTO thin films on Pt/Ti/SiO 2/Si substrate. The high tunability has been attributed to the (110) texture of the films and lager grain sizes.
URI: http://hdl.handle.net/10397/10098
ISSN: 1533-4880 (print)
DOI: 10.1166/jnn.2009.1235
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