Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/10057
Title: Characterization of GaN thin films on HVPE GaN templates
Authors: Zhu, CF
Fong, WK
Leung, BH
Chan, NH
Surya, C 
Keywords: Hall mobility
III-V semiconductors
Gallium compounds
Interface structure
Molecular beam epitaxial growth
Photoluminescence
Plasma materials processing
Semiconductor growth
Wide band gap semiconductors
Issue Date: 2001
Publisher: IEEE
Source: 2001 IEEE Hong Kong Electron Devices Meeting, 2001 : proceedings : June 2001, Hong Kong, p. 140-143 How to cite?
Abstract: Homoepitaxial growth of GaN thin films by RF plasma-assisted MBE on HVPE templates is examined in detail. Two different growth techniques are investigated. In one group of samples, the high-temperature GaN epitaxial layers were grown directly on HVPE-grown GaN/sapphire composite substrates. In another group of samples, intermediate temperature buffer layers (ITBLs) of 800 nm thick were first deposited on top of the HVPE GaN templates by MBE before the growth of high-temperature epitaxial GaN layers. Substantial improvements in both the photoluminescence and the Hall mobility are observed for samples grown with the use of ITBLs
URI: http://hdl.handle.net/10397/10057
ISBN: 0-7803-6714-6
DOI: 10.1109/HKEDM.2001.946935
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