Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/100315
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Title: Steep slope p-type 2D WSe 2 field-effect transistors with van der waals contact and negative capacitance
Authors: Wang, J 
Guo, X 
Yu, Z
Ma, Z
Liu, Y 
Chan, M
Zhu, Y 
Wang, X
Chai, Y 
Issue Date: 2018
Source: 2018 IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA , 1-5 Dec. 2018, p. 1-4
Abstract: Steep-slope p-type 2D WSe 2 back-gated field-effect transistors (FETs) are realized by using van der Waals Pt-WSe 2 contact and HfZrO 2 / Al 2 O 3 as the dielectric layer. The van der Waals Pt-WSe 2 contact is free from disorder and Fermi level pinning and decreases the subthreshold slope. The WSe 2 NCFET with van der Waals contact shows low subthreshold slope for both forward and reverse gate voltage sweep (the minimum SS forward =18.2 mV dec and SS reverse =44.1 mV dec) with a hysteresis as small as 20 mV at subthreshold region.
Publisher: IEEE
ISBN: 978-1-7281-1987-8 (Electronic)
978-1-7281-1988-5 (Print on Demand(PoD))
DOI: 10.1109/IEDM.2018.8614493
Rights: © 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
The following publication J. Wang et al., "Steep Slope p-type 2D WSe2 Field-Effect Transistors with Van Der Waals Contact and Negative Capacitance," 2018 IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA, 2018, pp. 22.3.1-22.3.4 is available at https://doi.org/10.1109/IEDM.2018.8614493.
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