Browsing by Keyword Elastic moduli

Showing results 1 to 14 of 14
DateTitleAuthor(s)
Mar-2009Can Young’s modulus and hardness of wire structural materials be directly measured using nanoindentation?Shu, S; Yang, Y; Fu, T; Wen, CS; Lu, J
1-Apr-2012Dynamic magnetoelastic properties of epoxy-bonded Sm₀. ₈₈Nd₀.₁₂Fe₁.₉₃ pseudo-1-3 negative magnetostrictive particulate compositeYang, F; Leung, CM; Or, DSW ; Liu, W; Zhang, Z; Duan, Y
16-May-2005Dynamic magnetomechanical properties of Terfenol-D/epoxy pseudo 1-3 compositesOr, DSW ; Li, T; Chan, HLW 
2005Estimation of air void and aggregate spatial distributions in concrete under uniaxial compression using computer tomography scanningWong, RHC; Chau, KT 
Jan-2006Evaluation of the effectiveness of representative methods for determining Young’s modulus and hardness from instrumented indentation dataMa, D; Zhang, T; Ong, CW 
1-Jan-2003Explicit formulas for effective piezoelectric coefficients of ferroelectric 0-3 composites based on effective medium theoryWong, CK; Poon, YM; Shin, FG
15-Jun-2007First-principles study of the cubic perovskites BiMO₃ (M=Al, Ga, In, and Sc)Wang, H; Wang, B; Li, Q; Zhu, Z; Wang, R; Woo, CH
19-Aug-2005Island, pit, and groove formation in strained heteroepitaxyLung, MT; Lam, CH ; Sander, LM
Oct-1999Mechanical, tribological, and stress analyses of ion-beam-deposited boron-rich boron nitride films with increasing N contentChan, KF; Ong, CW ; Choy, CL; Kwok, RWM
Jul-2004New relationship between Young's modulus and nonideally sharp indentation parametersMa, D; Ong, CW ; Wong, SF
May-2007A precise correcting method for the study of the superhard material using nanoindentation testsCao, YP; Dao, M; Lu, J
Jun-2001Relationship between the microstructure and nanoindentation hardness of thermally evaporated and magnetron-sputtered electrochromic tungsten oxide filmsOng, CW ; Wong, HY; Pang, GKH; Baba-Kishi, KZ; Choy, CL
Dec-2007A systematic study of the validation of Oliver and Pharr’s methodShu, S; Lu, J; Li, D
Oct-2003Tensile strength of zinc oxide films measured by a microbridge methodOng, CW ; Zong, DG; Aravind, M; Choy, CL; Lu, DR